Title:
PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2004318488
Kind Code:
A
Abstract:
To solve the problem that a conventional product inspection which detects the incorporation of the different kind of product and a defective product by performing pattern matching using a registered master pattern requires time and man-hours for registering the master pattern, resulting in high inspection cost.
By performing pattern matching mutually between products included in the aggregate of products, the processes of production and registration of the master pattern are eliminated.
Inventors:
TOYONAGA MANABU
SAKAMOTO NORIO
SAKAMOTO NORIO
Application Number:
JP2003111452A
Publication Date:
November 11, 2004
Filing Date:
April 16, 2003
Export Citation:
Assignee:
KONICA MINOLTA PHOTO IMAGING
International Classes:
G06T1/00; G06T7/00; (IPC1-7): G06T1/00; G06T7/00
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