Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PROFILE MEASURING METHOD OF REFRACTORY, AND THICKNESS MEASURING METHOD OF REFRACTORY
Document Type and Number:
Japanese Patent JP2009002765
Kind Code:
A
Abstract:

To provide a profile measuring method of refractory and a thickness measuring method of the refractory capable of measuring a remaining thickness of the refractory in a molten metal storage body lined with the refractory.

In this profile measuring method of the refractory in the molten metal storage body lined with the refractory, after storing a molten metal in the molten metal storage body, the molten metal is discharged from the molten metal storage body, and imaging including reference points arranged on the refractory body and its periphery is performed in the red hot state of the refractory body. In the imaging, a plurality of images having each different photographing angle to the same object are imaged, and image data thereby are acquired, and the profile of the refractory body is calculated.


Inventors:
FUKUSHIMA YASUMASA
HOSOHARA SEIJI
KIYOTA SADAKIMI
MAEDA EIZO
Application Number:
JP2007163329A
Publication Date:
January 08, 2009
Filing Date:
June 21, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
JFE STEEL KK
JFE REFRACTORIES CORP
International Classes:
G01B11/24; C21B7/14; C21B7/24; F27D1/00; G01B11/06
Attorney, Agent or Firm:
Toshihiko Ishikawa