Title:
PROGRAM FOR DATA PROCESSING, DATA PROCESSING DEVICE, AND MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2022050749
Kind Code:
A
Abstract:
To surely and easily acquire measurement value data generated in a measuring device and imaging data to be associated with it.SOLUTION: A program for data processing causes a processing section of a data processing device 2 capable of executing measurement value data acquisition processing for outputting measurement value data Dmh from a measuring device 1 and storing it in a storage section and imaging data acquisition processing for causing an imaging section to generate imaging data and storing it in the storage section to execute both processing. The program causes the processing section to execute first processing for displaying a measurement value stored in the measurement value data Dm from the measuring device 1 on a display section of the data processing device 2, second processing for transmitting a control command Dc that causes the measuring device 1 to hold the measurement value when a first condition is satisfied, and third processing for storing the measurement value data in the storage section in association with the imaging data stored in the storage section by imaging data acquisition processing executed along with the second processing when the measurement value data Dmh of the held measurement value is output, as measurement value data acquisition processing.SELECTED DRAWING: Figure 1
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Inventors:
YAGI YUKI
MIKI AKIHIKO
KAMBAYASHI TAKUYA
MIKI AKIHIKO
KAMBAYASHI TAKUYA
Application Number:
JP2020156849A
Publication Date:
March 31, 2022
Filing Date:
September 18, 2020
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01D9/00; G05B23/02; G08C17/00; G08C19/00
Attorney, Agent or Firm:
Shinji Sakai