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Title:
PROXIMITY SCANNING EXPOSURE APPARATUS AND PROXIMITY SCANNING EXPOSURE METHOD
Document Type and Number:
Japanese Patent JP2011090097
Kind Code:
A
Abstract:

To provide a proximity scanning exposure apparatus and a proximity scanning exposure method in which the unevenness in seams between adjoining exposure regions can be prevented upon performing proximity exposure, using a plurality of masks.

The proximity scanning exposure method includes the steps of measuring the respective gaps g between a mask M and a substrate W by using three gap sensors 87a, 87b, 87c, by each mask; adjusting the planarity of the mask M so as to control the differences in the gaps g to be within a tolerance, based on the respective measured gaps g; remeasuring the respective gaps g between the mask M and the substrate W by using the three gap sensors 87a, 87b, 87c, after the planarity of the mask M is adjusted by each mask; calculating the gap at the center position of the mask M from the remeasured gaps g; and adjusting the height of the mask M by driving a mask driver 12, in such a manner that the calculated gap at the center position of each mask M becomes identical to those of others.


Inventors:
KONDO TOSHIYUKI
Application Number:
JP2009242467A
Publication Date:
May 06, 2011
Filing Date:
October 21, 2009
Export Citation:
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Assignee:
NSK LTD
International Classes:
G03F7/20; G02F1/13; H01L21/027
Domestic Patent References:
JP2009122378A2009-06-04
JP2008306109A2008-12-18
JP2008304854A2008-12-18
JP2008304853A2008-12-18
JP2008304852A2008-12-18
JP2008304851A2008-12-18
JP2008304836A2008-12-18
JP2008304835A2008-12-18
JP2008304537A2008-12-18
Foreign References:
WO2008120785A12008-10-09
Attorney, Agent or Firm:
Shohei Oguri
Hironori Honda
Toshimitsu Ichikawa