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Title:
QUADRANT PROJECTION MEASURING DEVICE AND QUADRANT PROJECTION MEASURING METHOD
Document Type and Number:
Japanese Patent JP2013191186
Kind Code:
A
Abstract:

To obtain a quadrant projection measuring device in which a measuring time can be shortened.

A quadrant projection measuring device 10 comprises a command condition input section 1 which outputs a radius of a circular arc command and a feed speed, an acceleration/deceleration parameter input section 3 which outputs an acceleration/deceleration parameter, a measuring route generation section 2 which generates a measuring route including a partial circular arc route of a predetermined length determined from a route according to the circular arc command and including a portion in which a moving direction of at least one feeding shaft is inverted, based on the radius, the feed speed and the acceleration/deceleration parameter, a measuring position command generation section 4 which outputs a position command of a feeding shaft on the basis of the measuring route and the acceleration/deceleration parameter, servo control sections 5, 6 each performing servo control, such that a motor position of the feeding shaft follows up the position command, and an error waveform enlarging section 7 which performs processing for enlarging an error of a quadrature projection portion at the motor position in at least the partial circular arc route on the basis of the motor position.


Inventors:
NAGAOKA KOTARO
IUCHI SACHIHIRO
Application Number:
JP2012058936A
Publication Date:
September 26, 2013
Filing Date:
March 15, 2012
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G05B19/404; B23Q15/013; B23Q17/00; G05B19/4063; G05D3/00
Domestic Patent References:
JP2006227886A2006-08-31
Foreign References:
WO2010067651A12010-06-17
Attorney, Agent or Firm:
Hiroaki Sakai