Title:
QUANTITATIVE ANALYSIS SYSTEM AND QUANTITATIVE ANALYSIS METHOD OF GAS GENERATED DURING CHARGING/DISCHARGING OF SECONDARY CELL
Document Type and Number:
Japanese Patent JP2016118395
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a quantitative analysis system and a quantitative analysis method of a gas amount generated during charging/discharging of a secondary cell, capable of accurately and quickly quantifying the gas amount generated during the charging/discharging operation of the secondary cell such as a lithium ion secondary cell, and accurately and quickly quantifying the gas amount even when the type of the generated gas is the same as that of a main component of an atmosphere such as oxygen or nitrogen or in the case of gas easily dissolved in water.SOLUTION: The quantitative analysis method of a gas amount generated during charging/discharging of a secondary cell includes the step of performing a predetermined charging/discharging operation at the secondary cell, the step of supplying carrier gas not reacted with the component of the secondary cell and the gas generated during the charging/discharging into the secondary cell, and the step of quantitatively analyzing the gas generated during the charging/discharging.SELECTED DRAWING: Figure 4
Inventors:
FUJITA KIMIHIKO
Application Number:
JP2014256211A
Publication Date:
June 30, 2016
Filing Date:
December 18, 2014
Export Citation:
Assignee:
SUMITOMO METAL MINING CO
International Classes:
G01N1/22; G01N1/00; G01N30/26; G01N30/86; G01N30/88; H01M10/0525; H01M10/48
Attorney, Agent or Firm:
Aniya Setsuo