Title:
量子効率分布の取得方法、量子効率分布の表示方法、量子効率分布の取得プログラム、量子効率分布の表示プログラム、分光蛍光光度計及び表示装置
Document Type and Number:
Japanese Patent JP7284457
Kind Code:
B2
Abstract:
A method of obtaining a quantum efficiency distribution in a predetermined sample surface, including: irradiating a reference material with excitation light belonging to a first wavelength range; obtaining the reference material's image, which includes a first channel for the first wavelength range and a second channel for a second wavelength range, the first and the second channel's irradiation luminance value in each pixel; irradiating the predetermined sample surface with the excitation light; obtaining the first and the second channel's measurement luminance value in each pixel of the image of the predetermined surface; calculating an absorption luminance value from a difference between the first channel's irradiation luminance value and measurement luminance value; calculating a fluorescence luminance value from difference between the second channel's irradiation luminance value and measurement luminance value; calculating quantum efficiency of each pixel based on the values; and obtaining quantum efficiency distribution.
Inventors:
Jun Horigome
Hiroki Ohkawa
Takahiro Tamashima
Imari Sato
Zheng Yinqiang
Hiroki Ohkawa
Takahiro Tamashima
Imari Sato
Zheng Yinqiang
Application Number:
JP2019159440A
Publication Date:
May 31, 2023
Filing Date:
September 02, 2019
Export Citation:
Assignee:
Hitachi High-Tech Science Co., Ltd.
Inter-university research institute corporation information and systems research institute
Inter-university research institute corporation information and systems research institute
International Classes:
G01N21/64; G01J3/443
Domestic Patent References:
| JP2010151632A | ||||
| JP2018194428A | ||||
| JP2018155676A | ||||
| JP2008014689A | ||||
| JP2019020363A | ||||
| JP2018038184A |
Foreign References:
| WO2018198364A1 | ||||
| WO2010084566A1 | ||||
| US20090050536 |
Attorney, Agent or Firm:
Patent Attorney Corporation Eiko Office