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Patent Searching and Data


Title:
RADIATION IMAGING APPARATUS AND RADIATION IMAGING SYSTEM
Document Type and Number:
Japanese Patent JP2017208448
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a technique advantageous for reducing a noise component caused by incidence of an oblique incidence light to a side surface of a light detection part.SOLUTION: A radiation imaging apparatus comprises: a substrate; a scintillator arranged on an upper direction of the substrate; two light detection parts that are distributed between the substrate and the scintillator, and detect a light from the scintillator; and a shading member that is arranged between the scintillator and the two light detection parts. Two light detection parts are separated each other by a trench formed along a first direction in parallel with an upper surface of the substrate. The shading member includes a width larger than that of the trench in a plane view faced to the upper surface of the substrate, and is arranged along the first direction so as to be overlapped with one part of neighbor of the trench of each light detection part while being overlapped with the trench. The width of a region formed by overlapping one part of each light detection art in a second direction orthogonal to the first direction with the shading member is designed so that the light from the scintillator is not incident to the trench.SELECTED DRAWING: Figure 1

Inventors:
SAWADA SATORU
WATANABE MINORU
YOKOYAMA KEIGO
WAYAMA HIROSHI
FURUMOTO KAZUYA
Application Number:
JP2016099818A
Publication Date:
November 24, 2017
Filing Date:
May 18, 2016
Export Citation:
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Assignee:
CANON KK
International Classes:
H01L27/144; A61B6/00; G01T1/20; H01L27/146; H01L31/08; H01L31/10; H04N5/32; H04N5/369
Attorney, Agent or Firm:
Yasunori Otsuka
Yasuhiro Otsuka
Shiro Takayanagi
Shuji Kimura
Osamu Shimoyama
Nagakawa Yukimitsu