Title:
RADIATION MEASUREMENT DEVICE, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
Document Type and Number:
Japanese Patent JP2015025740
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation measurement technique in which a stable measurement performance is maintained without an increase in scale even in an environment where a use temperature condition changes.SOLUTION: A radiation measurement device 10 includes: a semiconductor detector 144 that moves electron/hole 12 which are generated by incidence of radiation 11 in mutually opposite directions along an electric field E; a reception unit 16 that receives a response signal of the electron/hole 12 which have moved to electrodes 15 (15a and 15b) that form electric fields; a database 17 that registers a control parameter which is generated on the basis of temperature dependent characteristics of the semiconductor detector 144; and a processing unit 18 that processes the response signal on the basis of the control parameter and derives an energy value of the radiation 11.
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Inventors:
KUME NAOTO
OKADA HISASHI
OKADA HISASHI
Application Number:
JP2013155585A
Publication Date:
February 05, 2015
Filing Date:
July 26, 2013
Export Citation:
Assignee:
TOSHIBA CORP
International Classes:
G01T1/24; G01T1/36
Attorney, Agent or Firm:
Patent business corporation Tokyo international patent firm