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Patent Searching and Data


Title:
RADIATION MEASURING METHOD
Document Type and Number:
Japanese Patent JPS58143286
Kind Code:
A
Abstract:

PURPOSE: To measure easily distribution of radiation energy and its intensity distribution, by using a solid-state image sensing element having a signal accumulating function.

CONSTITUTION: A semiconductor substrate 6 is provided with a solid-state image sensing element having a signal accumulating function for forming CCD consisting of a detection part 61, an accumulation part 62, and a reading part 63, etc. Accordingly, energy distribution and intensity distribution of radiation rays incident in parallel to the substrate 6 are measured easily through a data processor 9, an anergy distribution display device 10, an intensity distribution display device 11, etc. without using amplifiers, etc., corresponding to each element.


Inventors:
NARUSE YUUJIROU
YOSHIDA OKIO
Application Number:
JP2592082A
Publication Date:
August 25, 1983
Filing Date:
February 22, 1982
Export Citation:
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Assignee:
TOKYO SHIBAURA ELECTRIC CO
International Classes:
G01T1/24; G01T1/29; (IPC1-7): G01N23/04; G01T1/24; G01T1/29; G01T1/36
Attorney, Agent or Firm:
Noriyuki Noriyuki