Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
RADIATION NOISE MEASURED DATA DISPLAY METHOD, RADIATION NOISE MEASURING MEASURING SYSTEM AND PROGRAM STORAGE MEDIUM FOR RADIATION NOISE MEASUREMENT
Document Type and Number:
Japanese Patent JP2001264372
Kind Code:
A
Abstract:

To obtain a radiation noise measured-data display method, a radiations noise measuring system and a program storage medium, for radiation noise measurement, in which the grasp of data in the measurement of a radiation noise is judged simply and easily and in which labor required for a series of measures and a measurement can be reduced.

A frequency to be noticed is selected from radiations noise measuring frequencies, the difference between measured data and a standard value is calculated for each frequency to be noticed, and whether their difference value is large or small is displayed by using different colors. The content of measures taken for an object to be measured is displayed, and the object to be measured is collated with the content of the measures. The difference between the measured data and initial data is calculated. Whether their difference value is large or small is displayed by using different colors.


Inventors:
YAMANAKA YASUHIRO
KAWAGUCHI HIROTOMO
YOSHIZAWA TOSHIYUKI
Application Number:
JP2000076859A
Publication Date:
September 26, 2001
Filing Date:
March 17, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R29/08; (IPC1-7): G01R29/08
Domestic Patent References:
JPH1114680A1999-01-22
JPH08220164A1996-08-30
JPS62106317A1987-05-16
JP2000019204A2000-01-21
JPH0886821A1996-04-02
JPS5913963A1984-01-24
JPH0562869U1993-08-20
JPH01229980A1989-09-13
JPH10319071A1998-12-04
JPH08122417A1996-05-17
Attorney, Agent or Firm:
Kaneo Miyata (1 person outside)