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Title:
RADIATION NON-DESTRUCTIVE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JPH0694650
Kind Code:
A
Abstract:

PURPOSE: To positively detect abnormal access to a radiation source by a sample regardless of the irradiation direction of an X-ray source to an object to be inspected.

CONSTITUTION: This device applies a radiation from a radiation source 1 to a sample S to be inspected which is retained at a sample holder 11 and then detects the sample image according to the radiation transmittance using a radiation sensor. Then, access monitoring means 13, 15, etc., for detecting access of the sample S to the radiation source 1 exceeding a specific distance are provided in one piece with the sample holder 11 so that they can be moved.


Inventors:
SUZUKI SHINJI
NISHIYAMA YOJI
Application Number:
JP24177992A
Publication Date:
April 08, 1994
Filing Date:
September 10, 1992
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01N23/18; H05K3/34; (IPC1-7): G01N23/18
Attorney, Agent or Firm:
Aoki Akira (3 outside)



 
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