To provide a radiation-sensitive resin composition having high transparency for radiation, excellent basic performances as a resist such as sensitivity, resolution, dry etching durability, pattern profile, and suitable as a chemical amplification type resist having high resolution property in a fine pattern region.
The radiation-sensitive resin composition contains (A) a resin which contains a norbornene-based repeating unit derived from 5-(2-methyl-2- adamantyl)oxycarbonylbicyclo[2.2.1]hept-2-ene, 5-(1-methyl-1-cyclopentyl) ocycarbonylbicyclo[2.2.1]hept-2-ene or the like and a (meth)acrylate-based repeating unit derived from 3-hydroxy-1-adamantyl(meth)acrylate, 1-methyl-1- cyclohexyl(meth)acrylate or the like and which is converted into alkali-soluble by the effect of an acid, and (B) a radiation-sensitive acid generator.
ISHII HIROYUKI
SANO KIMIYASU
KOBAYASHI HIDEKAZU
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