Title:
放射能汚染検査装置
Document Type and Number:
Japanese Patent JP7223728
Kind Code:
B2
Abstract:
To provide a radioactive contamination inspection system capable of precisely measuring the radiation intensity of objects to be inspected with different shapes by suppressing deterioration in calculation accuracy of radioactive contamination due to recombination of electron-ion pairs.SOLUTION: The radioactive contamination inspection system includes: a shape measurement unit that measures the surface shape of the items to be inspected for radioactive contamination; electrodes for collecting electron-ion pairs that are ionized by radiation emitted from the items to be inspected; and a controller that is configured to align the electrodes so that the distance from the surface shape is within an allowable distance range based on the measurement result by the shape measurement unit and calculate the radioactive contamination amount of the items to be inspected based on the amount of the electron-ion pairs collected by the electrodes.SELECTED DRAWING: Figure 1
Inventors:
Keiichi Matsuo
Hiroshi Nishizawa
Hiroshi Nishizawa
Application Number:
JP2020129281A
Publication Date:
February 16, 2023
Filing Date:
July 30, 2020
Export Citation:
Assignee:
Mitsubishi Electric Plant Engineering Co., Ltd.
International Classes:
G01T1/169; G01T1/16; G01T1/167; G01T1/18
Domestic Patent References:
| JP6186342A | ||||
| JP2007240467A | ||||
| JP2017211347A | ||||
| JP55146070A |
Foreign References:
| US20010042835 |
Attorney, Agent or Firm:
Michiharu Soga
Kajinami order
Shunichi Ueda
Junichiro Yoshida
Takahiro Matsuoka
Kajinami order
Shunichi Ueda
Junichiro Yoshida
Takahiro Matsuoka