Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2018077091
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an X-ray inspection device which can inspect different shapes of inspection targets, the device being small in size, not easily leaking X-rays, and less frequently causing falling of a vertically long inspection target.SOLUTION: The X-ray inspection device 1a inspects an inspection target W conveyed in an X-ray shielding space S, by irradiating the target with X-rays. In an opening 3 of a housing dividing the space S, there is a shielding gate 5a formed of a pair of first shielding materials 6a and 6b movable in a lateral direction and a second shielding material 7 openable and closable in a longitudinal direction. An opening part 9 of the shielding gate where the target W passes may have any shape according to the outer shape of the target W. X-rays do not easily leak from the opening part, and the inspection device can easily deal with various different shapes of targets.SELECTED DRAWING: Figure 1
Inventors:
KATAOKA DAIKI
Application Number:
JP2016218271A
Publication Date:
May 17, 2018
Filing Date:
November 08, 2016
Export Citation:
Assignee:
ANRITSU INFIVIS CO LTD
International Classes:
G01N23/04
Domestic Patent References:
| JP2006343187A | 2006-12-21 | |||
| JP2012184940A | 2012-09-27 | |||
| JP2004125646A | 2004-04-22 | |||
| JPH08178872A | 1996-07-12 | |||
| JP3190710U | ||||
| JP2018077208A | 2018-05-17 |
Foreign References:
| US20130114788A1 | 2013-05-09 | |||
| US20070215821A1 | 2007-09-20 |
Attorney, Agent or Firm:
Norimitsu Nishimura
Noriyuki Suzuki
Noriyuki Suzuki