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Title:
RADIOSENSITIVE MATERIAL AND FORMATION OF PATTERN USING THE SAME
Document Type and Number:
Japanese Patent JPH05257285
Kind Code:
A
Abstract:

PURPOSE: To attain excellent transparency particularly to ultraviolet rays and sufficient dry etching resistance by using a polymer or a copolymer of cyclohexylmaleimide.

CONSTITUTION: The radiosensitive material is composed of a polymer or a copolymer of cyclohexylmaleimide. A resist made from the radiosensitive material is applied on the substrate to be processed to form a resist layer. The resist layer is selectively exposed to radiosensitive rays to be developed and a resist pattern is formed. In this case, the typical example of a comonomer constituting the useful copolymer is a monomer having a structure generating an alkali-soluble group by the action of an acid-generating agent and t- butylmethacrylate or tetrahydropyranyl methacrylate is exemplified as the monomer. It is particularly advantageous for the radiosensitive material to use the copolymer with the acid-generating agent.


Inventors:
Takechi Satoshi
Yuko Kaimoto
Koji Nozaki
Application Number:
JP5377292A
Publication Date:
October 08, 1993
Filing Date:
March 12, 1992
Export Citation:
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Assignee:
富士通株式会社
International Classes:
G03F7/004; G03F7/027; G03F7/038; G03F7/039; H01L21/027; H01L21/30; (IPC1-7): G03F7/038; G03F7/004; G03F7/027; G03F7/039; H01L21/027
Attorney, Agent or Firm:
Aoki Akira (2 outside)



 
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