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Patent Searching and Data


Title:
REFLECTION RATE MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JP2004177162
Kind Code:
A
Abstract:

To make accurately measurable the reflection rate on the surface of a sample having light transparency.

This reflection rate measuring instrument 10 is provided with a stage 11 movable along a horizontal direction, a reflection preventive material 13 laid on the stage 11 and mounted with the sample 12 on its upper face, a light source 14 for emitting directional light, and a photosensor 15 for photoreceiving reflected light from the sample 12. A dark-colored light dispersion sheet, for example, a black silicone rubber sheet of a coarse surface, is used as the reflection preventive material 13. The material 13 absorbs and diffuses the light from the light source 14 transmitted through the sample 12 to prevent the light from being reflected again toward the sample 12.


Inventors:
HAYASHI YUZO
Application Number:
JP2002340787A
Publication Date:
June 24, 2004
Filing Date:
November 25, 2002
Export Citation:
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Assignee:
ALPS ELECTRIC CO LTD
International Classes:
G01N21/47; G01M11/00; G01N21/01; (IPC1-7): G01N21/47; G01M11/00; G01N21/01
Attorney, Agent or Firm:
Masatake Shiga
Tadashi Takahashi
Takashi Watanabe
Masakazu Aoyama
Suzuki Mitsuyoshi
Kazuya Nishi
Yasuhiko Murayama