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Title:
RESIST COMPOSITION
Document Type and Number:
Japanese Patent JPH0413144
Kind Code:
A
Abstract:

PURPOSE: To prevent halation and notching on a high-reflective substrate, to stabilize a pattern against prebaking, to enhance resolution, and to restrain deterioration in sensitivity due to addition of a light absorbing agent by incorpo rating a specified compound as the light absorbing agent.

CONSTITUTION: The compound to be added as the light absorbing agent is represented by formula I in which each of R1 - R3 is independently H, optionally substituted alkyl, halogen, or OH; each of X and Y is independently cyano, -COOR, or CONHR'; R is alkyl; and R' is H or aryl. It is preferred to use the resist composition containing this compound as the positive type resist composition and the composition comprising a novolak resin obtained by polycondensing some of phenols with formaldehyde, and 1, 2-quinonediazideo compound, thus permitting halation and notching on the high-reflective substrate to be prevented, a pattern to be stabilized against prebaking, resolution to be enhanced, and deterioration of sensitivity due to addition of th agent to be restrained.


Inventors:
KITAO TEIJIRO
MATSUOKA MASARU
HANAWA RYOTARO
KAMIYA YASUNORI
TAKEYAMA NAOMOTO
HIOKI TAKESHI
TAKAGAKI HIROSHI
Application Number:
JP11598390A
Publication Date:
January 17, 1992
Filing Date:
May 02, 1990
Export Citation:
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Assignee:
SUMITOMO CHEMICAL CO
International Classes:
G03F7/004; G03F7/022; H01L21/027; H01L21/30; (IPC1-7): G03F7/004
Domestic Patent References:
JPH02269346A1990-11-02
Attorney, Agent or Firm:
Mitsuhiro Moroishi (1 person outside)



 
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