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Title:
SALT, ACID GENERATOR, RESIST COMPOSITION, AND PRODUCTION METHOD OF RESIST PATTERN
Document Type and Number:
Japanese Patent JP2012097074
Kind Code:
A
Abstract:

To provide a resist composition with which a pattern having an excellent focus margin can be obtained.

The present invention relates to a salt represented by formula (I) and a resist composition containing the salt. In the formula, Q1 and Q2 each independently represent a fluorine atom or a perfluoroalkyl group; L1 represents a divalent saturated hydrocarbon group, a methylene group included this group may also be substituted with an oxygen atom or a carbonyl group; W represents an alicyclic hydrocarbon group, a methylene group included in this group may also be substituted with an oxygen atom, sulfur atom, carbonyl group or sulfonyl group, and a hydrogen atom included in this group may also be substituted with a hydroxy group, alkyl group, alkoxy group, alicyclic hydrocarbon group or aromatic hydrocarbon group; Rfs represent each independently a fluorine atom or a fluorinated alkyl group; (n) represents an integer of 1 to 10; and Z+ represents an organic counter ion.


Inventors:
ICHIKAWA KOJI
OCHIAI MITSUYOSHI
HIRAOKA TAKASHI
Application Number:
JP2011206762A
Publication Date:
May 24, 2012
Filing Date:
September 22, 2011
Export Citation:
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Assignee:
SUMITOMO CHEMICAL CO
International Classes:
C07D321/10; C07C381/12; C07D321/12; C09K3/00; G03F7/004; G03F7/039; H01L21/027
Attorney, Agent or Firm:
Shinki Global IP Patent Corporation