Title:
試料解析システム
Document Type and Number:
Japanese Patent JP6638537
Kind Code:
B2
Abstract:
Provided is a sample-analyzing system used for identifying a target sample from its measurement data obtained using a plurality of analyzing devices including at least one device selected from a fluorescent X-ray analyzer, atomic absorption photometer and inductively coupled plasma emission analyzer as well as at least one device selected from an infrared spectrophotometer and Raman spectrophotometer. The system includes: a storage section (11) for holding measurement data obtained for each of the reference objects using the analyzing devices; a measurement data comparator (12) for comparing, for each analyzing device, the measurement data of the target sample with those of the reference objects and for determining the degree of matching of the target sample with each reference object; an integrated degree-of-matching calculator (15) for calculating an integrated degree of matching from the degrees of matching determined for the analyzing devices; and a comparison result output section (16) for outputting information concerning a predetermined number of reference objects in descending order of the integrated degree of matching.
Inventors:
Yukio Murakami
Application Number:
JP2016084964A
Publication Date:
January 29, 2020
Filing Date:
April 21, 2016
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N23/223; G01J3/42; G01J3/44; G01N21/31; G01N21/35; G01N21/63; G01N21/65
Domestic Patent References:
| JP2007003532A | ||||
| JP2015519571A |
Foreign References:
| US20120072122 | ||||
| US20130321793 | ||||
| US20130208850 |
Attorney, Agent or Firm:
Kyoto International Patent Office