Title:
SPECIMEN ANALYZER, SPECIMEN ANALYSIS METHOD AND PROGRAM
Document Type and Number:
Japanese Patent JP2023137001
Kind Code:
A
Abstract:
To provide a specimen analyzer, a specimen analysis method and a program with which it is possible to reduce the load of a computer that analyzes the data obtained by specimen measurement, using an artificial intelligence algorithm.SOLUTION: A specimen analyzer 4000 for analyzing an analyte in a specimen comprises a measurement unit 400 that includes an optical detection unit for acquiring a first optical signal from a first measurement sample and acquiring a second optical signal from a second measurement sample, and an analysis unit 300 that analyzes first data corresponding to the first optical signal and second data corresponding to the second optical signal. The analysis unit 300 executes the analysis of a first measurement item for the first measurement sample by a first analysis operation that processes the first data by an artificial intelligence algorithm, and executes the analysis of a second measurement item for the first measurement sample by the first analysis operation and/or a second analysis operation that processes a first representative value of the first data that corresponds to the feature of the analyte.SELECTED DRAWING: Figure 1
Inventors:
KIMURA TAKANOBU
SUZUKI KENICHIRO
NAKANISHI TOSHIJI
SUZUKI KENICHIRO
NAKANISHI TOSHIJI
Application Number:
JP2022042965A
Publication Date:
September 29, 2023
Filing Date:
March 17, 2022
Export Citation:
Assignee:
SYSMEX CORP
International Classes:
G01N33/48; G01N33/483; G01N33/53; G01N35/00
Attorney, Agent or Firm:
Masamasa Shibano
Makoto Ohashi
Makoto Ohashi
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