【発明の名称】分析装置のための制御された試料環境雰囲気

Title:

【発明の名称】分析装置のための制御された試料環境雰囲気

Document Type and Number:

Japanese Patent JP2003535325

Kind Code:

A

Abstract:

Apparatus for examining a sample by microscopy, spectroscopy or crystallography under controlled environmental conditions. The apparatus comprises a sample chamber ( 1 ) which is fed by a gas stream ( 19 ) having a known vapor content, which is generated by mixing two gas streams ( 18 & 16 ), one substantially saturated in a volatile substance ( 18 ) and one substantially free of the volatile substance ( 16 ), in a controlled manner. The temperature of the apparatus, and particularly of the sample chamber ( 1 ), is accurately controlled and regulated by temperature controller ( 7 ).

Inventors:

Levoger, curl
Williams, Daryl, Robert
Simpson, Dylan, Henry

Application Number:

JP2002500654A

Publication Date:

November 25, 2003

Filing Date:

May 30, 2001

Export Citation:

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Assignee:

SURFACE MEASUREMENT SYSTEMS LIMITED

International Classes:

G01N21/01; B01L1/00; C12M1/34; B01L7/00; (IPC1-7): G01N21/01; C12M1/34

Domestic Patent References:

JPH0545260A	1993-02-23
JPH07280748A	1995-10-27
JPH05285366A	1993-11-02

Foreign References:

WO1998020108A1

1998-05-14

Attorney, Agent or Firm:

Takashi Takeuchi (1 person outside)

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