To provide a sample evaluation device and a sample evaluation method capable of evaluating a crystalline sample without tilting the crystalline sample.

This sample evaluation method has a step S1 for acquiring a ZOLZ graphic 39 by transmitting an electron beam EB through a sample S, and a step S2 for determining a sample S thickness t and a lattice bending amount Δθ of a portion through which the electron beam EB is transmitted based on a geometric characteristic of the ZOLZ graphic and on a correspondence relation between the sample thickness and the lattice bending amount.

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