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Title:
SAMPLE-AND-HOLD CIRCUIT
Document Type and Number:
Japanese Patent JP2006252745
Kind Code:
A
Abstract:

To provide a sample-and-hold circuit which prevents the occurrence of output voltage distortion caused by an influence of a charge distribution effect.

The sample-and-hold circuit 300 includes a switch SW1, a capacitor CAP1, and an amplifier 310. The switch SW1 has a 1st terminal to receive an input signal Vin and transmit the input signal Vin to a 2nd terminal of the switch SW1 in a sample period. A 1st terminal of the capacitor CAP1 is coupled to the 2nd terminal of the switch SW1, and a 2nd terminal of the capacitor CAP1 is coupled to a voltage for storing the sampling result of the input signal Vin. The amplifier 310 is coupled to the 2nd terminal of the switch SW1, wherein the amplifier is disabled in the sample period, and the amplifier is enabled to generate an output signal according to the sampling result in the hold period.


Inventors:
YEN CHIH-JEN
HSU CHIH-HSIN
Application Number:
JP2005251011A
Publication Date:
September 21, 2006
Filing Date:
August 31, 2005
Export Citation:
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Assignee:
RENEI KAGI KOFUN YUGENKOSHI
International Classes:
G11C27/02; H03F1/32; H03F3/45; H03K17/00
Attorney, Agent or Firm:
Tamio Nishiwaki