Title:
SAMPLE MEASURING PROBE DEVICE
Document Type and Number:
Japanese Patent JP3523688
Kind Code:
B2
Abstract:
PURPOSE: To provide a sample measuring probe device capable of measuring a sample provided in a liquid in the noncontact mode without distorting the sample.
CONSTITUTION: An elastic body 1 supported by a support section 3 and having a probe 2 at the free end is arranged in a solution 4 holding a sample 5, and the elastic body 1 is forcibly excited and vibrated by a drive source 6 at the inherent frequency of the elastic body 1. When the tip of the probe 2 is moved near to the surface of the sample 5, the fluctuation of the vibration state of the elastic body 1 is detected by a displacement detector 7, the detected output of the displacement detector 7 is inputted to a sample data display device 8, and the topographic image of the sample 5 is obtained.
Inventors:
Kajimura, Hiroshi
Application Number:
JP17621094A
Publication Date:
April 26, 2004
Filing Date:
July 06, 1994
Export Citation:
Assignee:
OLYMPUS OPTICAL CO LTD
International Classes:
G01B21/30; G01B5/28; G01N37/00; G01Q30/08; G01Q30/14; G01Q30/20; G01Q60/24; G01Q60/32; G01Q60/38; G01Q80/00; (IPC1-7): G01N13/16; G01B21/30; G01N13/10
Other References:
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Attorney, Agent or Firm:
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