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Title:
SAMPLE OBSERVATION DEVICE
Document Type and Number:
Japanese Patent JP2022166290
Kind Code:
A
Abstract:
To provide a sample observation device which can reduce astigmatism of observation light.SOLUTION: A sample observation device 1 comprises: an irradiation optical system 3 which irradiates a sample S with planar light L2; a scan unit 4 which scans the sample S in one direction so as to pass through the irradiation surface R of the planar light L2; an image formation optical system 5 which has an observation axis P2 inclined with respect to the irradiation surface R and forms an image with the observation light L3 generated in the sample S by the irradiation with planar light L2; an image acquisition unit 6 which acquires image data 31 corresponding to the light image of the observation light L3 whose image is formed by the image formation optical system 5; and an image generation unit 8 which generates observation image data 32 of the sample S on the basis of the image data 31 acquired by the image acquisition unit 6. The image formation optical system 5 includes a non-axial symmetric optical element which bends the light ray L3a of one axis of the observation light L3 but does not bend the light ray L3b of the other axis orthogonal to the one axis.SELECTED DRAWING: Figure 9

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Inventors:
Masanori Kobayashi
Satoshi Yamamoto
Application Number:
JP2022133252A
Publication Date:
November 01, 2022
Filing Date:
August 24, 2022
Export Citation:
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Assignee:
Hamamatsu Photonics Co., Ltd.
International Classes:
G02B21/00; G02B3/06; G02B21/06; G02B21/36
Domestic Patent References:
JP2017501429A2017-01-12
JP2016535861A2016-11-17
JP2016525229A2016-08-22
JP2000090247A2000-03-31
JP2016537670A2016-12-01
JP2017513063A2017-05-25
JP2016537671A2016-12-01
JP2014202967A2014-10-27
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama
Hiromitsu Nakayama



 
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