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Title:
SAMPLE PREPARATOR FOR MASS SPECTROMETRY
Document Type and Number:
Japanese Patent JP2003098154
Kind Code:
A
Abstract:

To easily specify a location of laser irradiation for ionization.

Air is supplied by bringing a micro nozzle 12 for supplying air closely to one end of sample solution 8. In a dispensation spot 6, evaporation from the surface of the sample solution 8 is activated at a part supplied with air and crystallization progresses abruptly as compared with other parts. Subsequently, a gradient of concentration is generated in the sample solution due to local crystallization thereof and noncrystallized solute flows to the vicinity of a crystal and crystallizes. As a result, a crystal grows around the part supplied with air. Optimal location of laser irradiation can be facilitated for such a crystal and high speed automatic processing can be realized by delivering the positional information of the micro nozzle for air supply to a TOFMS and determining the laser irradiation position based on that positional information.


Inventors:
YAMAGUCHI AKIRA
IKEGAMI TAKASHI
SUGIYAMA KIYOHIRO
AKINAGA NOBUYUKI
Application Number:
JP2001288609A
Publication Date:
April 03, 2003
Filing Date:
September 21, 2001
Export Citation:
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Assignee:
SHIMADZU CORP
JAPAN SCIENCE & TECH CORP
International Classes:
G01N27/64; G01N1/00; G01N1/28; G01N27/62; H01J49/04; (IPC1-7): G01N27/64; G01N1/00; G01N1/28; G01N27/62; H01J49/04
Attorney, Agent or Firm:
Noguchi Shigeo