Title:
試料支持体、イオン化法及び質量分析方法
Document Type and Number:
Japanese Patent JP7186187
Kind Code:
B2
Abstract:
A sample support body is for ionization of a sample. The sample support body includes a substrate including a first surface and a second surface on sides opposite to each other, and a conduction layer provided at least on the first surface. A plurality of through-holes opening on the first surface and the second surface are formed in an effective region of the substrate, the effective region being for ionizing components of the sample. A width of a second opening on the second surface side is larger than a width of a first opening on the first surface side in each of the plurality of through-holes.
Inventors:
Masahiro Otani
Takayuki Omura
Takayuki Omura
Application Number:
JP2019570636A
Publication Date:
December 08, 2022
Filing Date:
January 16, 2019
Export Citation:
Assignee:
Hamamatsu Photonics Co., Ltd.
International Classes:
G01N27/62; H01J49/04; H01J49/16
Domestic Patent References:
| JP3122331U | ||||
| JP6093492B1 | ||||
| JP2007529001A | ||||
| JP2009080106A | ||||
| JP2004354376A | ||||
| JP2010071664A |
Foreign References:
| WO2017038710A1 |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama
Yoshiki Kuroki
Kenichi Shibayama