Title:
SAMPLE TEMPERATURE CONTROLLER FOR ANALYZING DEVICE
Document Type and Number:
Japanese Patent JPH01199218
Kind Code:
A
Abstract:
PURPOSE:To avoid occurrence of an offset by adding the temperature sensors to a sample and a sample placing stage and controlling the electric power supplied to a heater by using the temperature of the sample placing stage as a control signal when the difference between the temperatures of the sample placing stage and the sample exceeds a fixed level and then the temperature of the sample as a control signal when said difference of temperatures is under the fixed level respectively. CONSTITUTION:When a thermostatic chamber 4 is opened for inspection, etc., the temperature of a measurement cell 3 drops rapidly with the influence of the open air temperature because the cell 3 has the smaller heat capacity than a metallic block 1. Therefore the difference of temperatures between 1st and 2nd temperature sensors 5 and 6 exceeds a set difference DELTAT. Then a 1st comparator 12 transmits a signal of a high level and sends the signal received from the sensor 6 to a 2nd comparator 15. As a result, a power control circuit 16 controls the electric power so that the temperature of the block 1 is kept at a reference level T0.
Inventors:
AMITA KOUJI
MUTSUNO KOJI
MUTSUNO KOJI
Application Number:
JP2468788A
Publication Date:
August 10, 1989
Filing Date:
February 03, 1988
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N27/28; G05D23/00; G05D23/24; (IPC1-7): G01N27/28; G05D23/00; G05D23/24
Attorney, Agent or Firm:
Keiji Nishikawa (1 person outside)