Specimen evaluation method - Olympus Endo Technology America Inc.

Title:

Specimen evaluation method

Document Type and Number:

Japanese Patent JP6348976

Kind Code:

B2

Inventors:

Kazutaka Nishikawa

Application Number:

JP2016527659A

Publication Date:

June 27, 2018

Filing Date:

February 20, 2015

Export Citation:

Assignee:

Olympus Endo Technology America Inc.

International Classes:

G01N15/04; G01N33/483

Domestic Patent References:

Attorney, Agent or Firm:

Kunio Ueda
Junichiro Yanagi
Mayumi Oguri
Kunihiko Takeuchi

Previous Patent: A junction neighborhood elimination device of the liquid crystal display by edge display

Next Patent: JPS6348977