Title:
サンプリング装置およびサンプリング方法
Document Type and Number:
Japanese Patent JP5331575
Kind Code:
B2
Abstract:
Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
Inventors:
Kano Eiji
Takayuki Akita
Masayuki Kawabata
Takayuki Akita
Masayuki Kawabata
Application Number:
JP2009129598A
Publication Date:
October 30, 2013
Filing Date:
May 28, 2009
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R13/34
Domestic Patent References:
| JP63316522A | ||||
| JP2000059219A | ||||
| JP63261166A | ||||
| JP11355141A |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation
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