Title:
サンプリング装置および試験装置
Document Type and Number:
Japanese Patent JP5331375
Kind Code:
B2
Abstract:
To provide a sampling device having a short measuring time.
This sampling device for sampling a repeated signal repeated for every repeating period determined beforehand has: a sampling part for sampling at a plurality of sampling timings which is larger than the number of a repeating period of the repeated signal over a plurality of repeating periods, and outputting a plurality of sampling data; and an alignment part for aligning the plurality of sampling data in the order of the phase of each repeated signal, and outputting waveform data acquired by sampling each repeated signal.
COPYRIGHT: (C)2010,JPO&INPIT
Inventors:
Koichiro Uekusa
Masayuki Kawabata
Masayuki Kawabata
Application Number:
JP2008120656A
Publication Date:
October 30, 2013
Filing Date:
May 02, 2008
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R13/34; G01R13/20; G01R31/28
Domestic Patent References:
| JP3004621A | ||||
| JP3263924A | ||||
| JP2002156389A | ||||
| JP61071499A |
Attorney, Agent or Firm:
Akihiro Ryuka