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Title:
SCANNING CYTOMETER
Document Type and Number:
Japanese Patent JP3735190
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To automatically set a measurement condition parameter on the basis of cell data of a wide range by determining the measurement condition parameter for use in an actual measurement on the basis of a statistical parameter obtained through a temporary measurement.
SOLUTION: According to this scanning cytometer, a sample 7 is scanned with laser spots in two dimensions, and fluorescent and scattering light from the sample 7 are detected by a photoelectric multiplier 15 and a photodiode 11. In a temporary measurement before an actual measurement, a cell group sample is scanned in two dimensions at high speed over a wider range than in the actual measurement according to a measurement condition parameter obtained by a temporary pre-measurement initial setting means, and statistical data of the cell group is obtained. A measurement condition parameter to be used in the actual measurement is determined on the basis of the statistical data obtained in the temporary measurement. Information of a wide range to determine an optimum value of the measurement condition parameter can be obtained in a short time, so that a work by an operator to judge validity of the measurement condition parameter and set the measurement condition parameter is reduced.


Inventors:
Kotaro Shimizu
Application Number:
JP29553397A
Publication Date:
January 18, 2006
Filing Date:
October 28, 1997
Export Citation:
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Assignee:
Olympus Endo Technology America Inc.
International Classes:
G01N21/64; G01N33/48; G01N15/14; G01N21/78; G01N33/483; G06T7/00; G06T7/60; (IPC1-7): G01N33/48; G01N21/78; G01N33/483
Domestic Patent References:
JP56072845A
Attorney, Agent or Firm:
Takehiko Suzue
Sadao Muramatsu
Atsushi Tsuboi
Tetsuya Kazama
Koji Mizuno