To provide a scanning probe microscope suitably adapted to the study of the observation of the lattice of lines of magnetic induction or an electron state in a magnetic flux inlusive of the study of a nanoscale non-uniform superconductive state and the observation of the uneven image on the surface of a sample, and its using method.
As the probe 12 of the scanning probe microscope, a pressure inducing superconductive substance is used. As the pressure inducing superconductive substance, for example, La2-xBaxCuO4 (x is in the vicinity of 1/8) is used. When the probe 12 is brought into contact with the surface of a sample, the leading end part of the probe 12 becomes a superconductive state by the pressure applied to the leading end part of the probe and the current-voltage characteristics between the probe 12 and the sample 13 are changed by Andreev reflection.
TANDA SATOSHI
IDO MASAYUKI
MOMONO NAOKI
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