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Patent Searching and Data


Title:
SCANNING PROBE MICROSCOPE
Document Type and Number:
Japanese Patent JPH07260801
Kind Code:
A
Abstract:

PURPOSE: To enable high-speed and highly accurate observation of a specimen having a rough surface by providing a scattered-ray-filter means with an opening at the focusing point of the reflected ray which has passed through a condenser.

CONSTITUTION: A ray 9 reflected on the surface of a cantilever 5 is collected with a condenser 6. A scattered-ray-filter means 7 has a small opening, at which the ray collected with the lens 6 focuses. Then, the ray focuses at the small opening and is projected on a ray detector 8. A ray 10 falling not on the cantilever 5 but on a specimen does not focus at the opening or is projected on the ray detector 8, because it is blocked with the scattered-ray-filter means 7. Thus, a ray that could be a noise is not projected the ray detector 8.


Inventors:
ISHII NOBUHITO
Application Number:
JP4892594A
Publication Date:
October 13, 1995
Filing Date:
March 18, 1994
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G01B21/30; G01N37/00; G01Q20/02; G01Q90/00; H01J37/28; (IPC1-7): G01N37/00; G01B21/30; H01J37/28