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Title:
SEALING MATERIAL INSPECTION DEVICE AND SEALING MATERIAL INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2013080799
Kind Code:
A
Abstract:

To provide an inspection device and an inspection method, which identify a fluctuation factor of spectrum conversion efficiency of a sealing material which seals a light emitting body.

A sealing material inspection device 100 comprises: a particle state evaluation unit 101 which measures a shape of a phosphor particle contained in a sealing material 1004 which is an object to be measured; an optical characteristic evaluation unit 102 which detects a spectrum of the sealing material 1004; and a PC 105 for data processing calculation which analyses the shape and the spectrum.


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Inventors:
NAGAHAMA ISAYUKI
OIKAZE HIROTOSHI
ITO TOMONORI
NISHIWAKI KENTARO
Application Number:
JP2011219579A
Publication Date:
May 02, 2013
Filing Date:
October 03, 2011
Export Citation:
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Assignee:
PANASONIC CORP
International Classes:
H01L33/00; H01L51/50; H05B33/04; H05B33/10; H05B33/12
Attorney, Agent or Firm:
Hiromori Arai



 
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