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Title:
SECONDARY BATTERY INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2014006205
Kind Code:
A
Abstract:

To provide a secondary battery inspection method configured to detect micro-short circuit in a battery in a short time easily with high accuracy.

A secondary battery inspection method includes: a first voltage drop measurement process that adjusts a secondary battery 1 to an arbitrary SCO and measures voltage decreased during aging processing; a second voltage drop measurement process which is repeated a plurality of times, charges the secondary battery 1 only with an arbitrary amount of current to adjust the SOC to be different from the SOC which has been set for past voltage drop measurement to measure the voltage drop during the aging processing; a first estimation process that calculates a first estimated SOC from the voltage drop in the first voltage drop measurement process and a reference line; a second estimation process that adjusts the first estimated SOC with the amount of current in the second voltage drop measurement process to calculate a second estimated SOC; and a determination process that compares an actual measurement line showing a relation between the voltage drops in the voltage drop measurement processes and the first and second estimated SOCs with the reference line to determine a micro-short circuit.


Inventors:
ONODA YUSUKE
Application Number:
JP2012143566A
Publication Date:
January 16, 2014
Filing Date:
June 26, 2012
Export Citation:
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Assignee:
TOYOTA MOTOR CORP
International Classes:
G01R31/36; H01M10/42
Domestic Patent References:
JP2010223768A2010-10-07
JP2003123850A2003-04-25
JP2011069775A2011-04-07
JP2002246073A2002-08-30
JP2012084332A2012-04-26
JP2007113953A2007-05-10
JP2010257984A2010-11-11
JP2009004389A2009-01-08
JP2011047918A2011-03-10
Attorney, Agent or Firm:
Juichiro Yano
Hideaki Masatsu