SECONDARY PARTICLE GENERATION DEVICE, RADIOACTIVE ISOTOPE GENERATION DEVICE, SECONDARY PARTICLE GENERATION METHOD AND RADIOACTIVE ISOTOPE GENERATION METHOD

Japanese Patent JP2021174617

A

To provide a secondary particle generation device, a radioactive isotope generation device, a secondary particle generation method and a radioactive isotope generation method, which forms a hollow charged particle beam having a hollow beam intensity distribution and can effectively take out pion and muon from a target.SOLUTION: A secondary particle generation device (1) includes: an accelerator (5) which accelerates and radiates a charged particle beam generated at a beam source (3); a target (7); and multipole electromagnets (50) at least one or more of which are provided, between the accelerator and the target, on a traveling path of the charged particle beam emitted from the accelerator and which have magnetic poles having six or more poles to form a first magnetic field having a non-linear magnetic flux density distribution. The secondary particle generation device makes the charged particle beam pass inside the multipole electromagnets to generate a hollow charged particle beam (Bm), and irradiates a cross section of the target with the hollow charged particle beam to generate at least secondary particles.SELECTED DRAWING: Figure 2

FUKUDA MITSUHIRO
TOMONO DAI
MORITA YASUYUKI
YURI YOSUKE

JP2020075957A

November 01, 2021

April 22, 2020

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UNIV OSAKA

H05H7/12; G21K5/08; H05H7/04

Makoto Ono
Kenkyo Kanayama
Mitsuaki Tsubokura
Kazuki Shigemori
Kenji Ando
Hidehiko Ichikawa
Yoshie Sakurada
Yousuke Kawasaki
Takuya Gomibuchi
Toshikazu Imato
Yoichi Iino
Yusuke Ichikawa
Masahiro Moriyama
Takashi Kono
Yoshikazu Iwase
Yasufumi Shiroyama

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