PURPOSE: To employ a resin mold for lowering the packaging cost of an IC and reduce deterioration of high frequency characteristics of the IC.
CONSTITUTION: There are formed a first protective film 15 for securing reliability on the surface of a semiconductor integrated circuit(IC), and a second protective film 30 for reducing the deterioration of high frequency characteristics on the same. The second protective film 30 is composed of a material having a smaller dielectric constant than that of a resin molding material. Hereby, the second protective film having a lower dielectric constant enters between electrodes of an active element in the IC, and hence the resin molding material of a higher dielectric constant is prevented from entering, so that the second protective film restricts an increase of interelectrode capacitance to reduce the deterioration of high frequency characteristics.