Title:
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL SYSTEM, AND AUTOMOBILE
Document Type and Number:
Japanese Patent JP2017083226
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor device and an electronic control system in which the accuracy of detecting abnormality in a plurality of redundant sensors is improved.SOLUTION: The semiconductor device comprises: a plurality of internal sensors TS1, TS2 for detecting the same detection object; a selector circuit SEL for switching between each of detection signals from the plurality of internal sensors TS1, TS2 at a prescribed frequency and outputting the selected signal; a correction information extraction circuit 552 for extracting a first frequency component for correcting the output signal of a prescribed external sensor from a conversion signal based on output of the selector circuit SEL; and an abnormality information extraction circuit 553 for extracting a second frequency component for detecting abnormality in the plurality of internal sensors TS1, TS2 from a conversion signal based on output of the selector circuit SEL.SELECTED DRAWING: Figure 6
Inventors:
KASUYA KOUJI
Application Number:
JP2015209769A
Publication Date:
May 18, 2017
Filing Date:
October 26, 2015
Export Citation:
Assignee:
RENESAS ELECTRONICS CORP
International Classes:
G01D21/02; G01C19/00; G01C19/5614; G01M17/007; G08C15/02; G08C19/00
Attorney, Agent or Firm:
Ken Ieiri
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