To add a boundary scan function to an integrated circuit, to suppress a boundary scan circuit becoming useless after its shipment to a minimum, to reduce the cost of the boundary scan circuit itself and to perform an inspection quickly.

A test control block circuit is removed from an integrated circuit having an analog boundary scan function, Instead, terminals for test are installed. A control signal for test is input directly. As the terminals for test, a TCK terminal 8, a TDI terminal 13, a TDO terminal 16, a Shift-DR terminal 9, a Capture-DR terminal 10, an Update-DR terminal 11, an Enable terminal 12, a Mode 1 terminal 47a, a Mode 2 terminal 47b, an analog test bus terminal 35a, and an analog test bus terminal 35b are provided. In addition, the respective terminals for test are installed at the interposer of a semiconductor device, respective control signals are input from an inspection apparatus, and a boundary scan test is performed.