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Patent Searching and Data


Title:
SEMICONDUCTOR DEVICE, MANUFACTURE THEREOF, SEMICONDUCTOR DEVICE UNIT AND MANUFACTURE THEREOF
Document Type and Number:
Japanese Patent JPH07221132
Kind Code:
A
Abstract:

PURPOSE: To improve the mold release characteristics of a metal mold and the reliability of a semiconductor device while a miniaturization of the device is contrived in the semiconductor device, wherein a semiconductor element is resin-sealed, and a method of manufacturing the device.

CONSTITUTION: In a semiconductor device, which is provided with a semiconductor element 1, a substrate 2 to be mounted with this element 1 and a resin 3 for sealing the element 1, a resin filling hole 14 is formed in the substrate 2 and the resin 3 is introduced through the surface different from the surface, which is arranged with the element 7, of this substrate 2 via the hole 14 to seal the element 1. Accordingly, it becomes possible that the resin 3 is directly introduced on the substrate via the hole 14 to seal the element 1. Thereby, the need to provide a cull part, a runner part or the like, through which the resin 3 is hardly passed, in a metal mold like a conventional method is eliminated and it becomes possible to lessen the contact area of the resin 3 with the metal mold. As a result, the kinds of a mold release agent and the addition amount of the resin can be selected without paying regard to the mold release characteristics of the metal mold.


Inventors:
KAWAHARA TOSHISANE
OOSAWA MITSUHIRO
KATOU SADATSUGU
ISHIGURO HIROYUKI
SAKURAI YUJI
NAKASEKO SHINYA
KASAI JUNICHI
TANIGUCHI SHINICHIRO
OSUMI MAYUMI
Application Number:
JP30117594A
Publication Date:
August 18, 1995
Filing Date:
December 05, 1994
Export Citation:
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Assignee:
FUJITSU LTD
KYUSHU FUJITSU ELECTRONIC
International Classes:
H01L23/28; H01L21/56; H01L23/12; H01L23/29; H01L23/31; (IPC1-7): H01L21/56; H01L23/12; H01L23/28; H01L23/29; H01L23/31
Attorney, Agent or Firm:
Tadahiko Ito