Title:
SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTING THE SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2017083310
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor device that is highly reliable, can be manufactured at a low cost, and has a MOS analog circuit easily detecting potential defects.SOLUTION: The MOS analog circuit is switched between a test mode and an operation mode based on a control circuit supplied from the outside. In the test mode, a voltage between a power source terminal and a reference terminal is applied on a gate oxide film of a MOS transistor in the MOS analog circuit.SELECTED DRAWING: Figure 2
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Inventors:
SAKAGUCHI KAORU
Application Number:
JP2015212166A
Publication Date:
May 18, 2017
Filing Date:
October 28, 2015
Export Citation:
Assignee:
SII SEMICONDUCTOR CORP
International Classes:
G01R31/28; G01R31/3185; H01L21/822; H01L27/04
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