Title:
半導体装置及びノイズ計測方法
Document Type and Number:
Japanese Patent JP5270173
Kind Code:
B2
Abstract:
Provided is a semiconductor device for outputting only the necessary information from non-periodic noise information to the outside. An analysis object information extracting section specifies analysis object information used to analyze noise associated with a malfunction from the non-periodic noise information having a large amount of information and extracts only the specified analysis object information from the noise information. A communication section outputs the extracted analysis object information to the outside. Thus, the amount of the information can be reduced and the noise information can be outputted by an inexpensive communication section such as a serial communication device.
Inventors:
Tomio Sato
Application Number:
JP2007556741A
Publication Date:
August 21, 2013
Filing Date:
February 01, 2006
Export Citation:
Assignee:
富士通株式会社
International Classes:
G01R29/26; G01R31/28; H01L21/822; H01L27/04
Domestic Patent References:
| JP2005098981A | 2005-04-14 | |||
| JP2004233235A | 2004-08-19 | |||
| JPH05334457A | 1993-12-17 |
Attorney, Agent or Firm:
Takeshi Hattori