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Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2014204360
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a flip-flop circuit which can relieve defects and on which existing scanning technology can be applied.SOLUTION: A flip-flop circuit comprises: a latch part composed so as to latch input data and output output data; a redundant latch part composed so as to latch redundant input data and output redundant output data; and a relief control circuit for performing failure detection and relief of the latch part. At the time of detecting failure, the relief control circuit detects failure of the latch part by comparing the input data and the output data. When failure is detected, the relief control circuit supplies the input data to the redundant latch part as the redundant input data and supplies the redundant output data to a subsequent stage of the latch part as the output data.

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Inventors:
FUJITA SHIGEKI
Application Number:
JP2013080415A
Publication Date:
October 27, 2014
Filing Date:
April 08, 2013
Export Citation:
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Assignee:
RENESAS ELECTRONICS CORP
International Classes:
H03K5/00; G01R31/28; H01L21/82; H01L21/822; H01L27/04; H03K19/003
Attorney, Agent or Firm:
Minoru Kudo



 
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