Title:
Semiconductor device
Document Type and Number:
Japanese Patent JP6257264
Kind Code:
B2
Abstract:
A fuse, a resistor, and a transistor, which serve as an abnormality history setting unit, are provided in series between external terminals. The transistor receives a specific abnormality detection signal on its base from an abnormality detection circuit. The specific abnormality detection signal becomes “H” level in order to bring the transistor into an on state when a specific abnormal phenomenon to be detected occurs out of plural types of abnormal phenomena. The abnormality history setting unit executes an abnormality history operation for turning on the transistor and allowing a current exceeding a disconnection level to flow through the fuse provided between the external terminals to disconnect the fuse.
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Inventors:
Motonobu Jou
Application Number:
JP2013223804A
Publication Date:
January 10, 2018
Filing Date:
October 29, 2013
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
H03K17/08; H02H3/04; H03K17/60
Domestic Patent References:
| JP2008148104A | ||||
| JP4101613A | ||||
| JP11299073A |
Foreign References:
| US20100023286 |
Attorney, Agent or Firm:
Yoshitake Hidetoshi
Takahiro Arita
Takahiro Arita