To provide a semiconductor element which allows relatively easy judgment on whether or not the element carries an identification mark.

A random reflection suppressing section 15 having reflectance higher than that of a defectless/defective state indicating mark 16 is provided at the central part of the surface of a semiconductor element 19 and the mark 16 is put on the section 15 in accordance with the defectless/defective state of the element 10. Since the presence/absence of the mark 16 can be judged easily based on the difference between the high reflectance of the section 15 when the mark 16 is not put on the section 15 and the low reflectance of the mark 16, the element 10 can be sorted accurately based on the judgment result of the presence/absence of the mark 16 in accordance with the judgment result.