PURPOSE: To provide a gate electrode stable in characteristics and to form a self-aligned contact(SAC) without overetching an insulating film which covers the gate electrode when the contact is bored.
CONSTITUTION: A polysilicon wiring 10 is formed on a semiconductor substrate 1, wherein a polysilicon film 5 is formed on a part of the polysilicon wiring 10 located on a gate electrode 3 to make the wiring 10 thick. Therefore, the gate electrode 3 is prevented from being doped with impurities injected into the wiring 10. When a gate SAC is formed on the semiconductor substrate 1 provided with a polysilicon gate, the polysilicon film 5 is formed on the insulating film 4 provided onto the gate electrode 3, whereby the insulating film 4 is prevented from being overetched.