Title:
SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREFOR
Document Type and Number:
Japanese Patent JP2016180673
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit and a test system of the semiconductor integrated circuit which diagnose an oscillator while suppressing the increase in area of a chip as much as possible.SOLUTION: A transmission section 4, a reception section 5, and a detection section 6 are provided in the vicinity of an oscillator 3, but the reception section 5 and the detection section 6 are not affected by the oscillator 3 because the transmission section 4 and the reception section 5 are electrically insulated. Thus, the oscillator 3 can be diagnosed while an area required for installation of the transmission section 4, the reception section 5, and the detection section 6 is suppressed as much as possible.SELECTED DRAWING: Figure 1
Inventors:
FUJITA YOHEI
Application Number:
JP2015060839A
Publication Date:
October 13, 2016
Filing Date:
March 24, 2015
Export Citation:
Assignee:
DENSO CORP
International Classes:
G01R31/28; G01R23/07; G01R31/302; H01L21/822; H01L27/04; H04B5/02
Domestic Patent References:
| JP2006284565A | 2006-10-19 | |||
| JP2011146822A | 2011-07-28 | |||
| JP2002184872A | 2002-06-28 | |||
| JP2003533882A | 2003-11-11 | |||
| JP2007078407A | 2007-03-29 | |||
| JP2004072175A | 2004-03-04 |
Foreign References:
| US20090167339A1 | 2009-07-02 |
Attorney, Agent or Firm:
Patent Business Corporation Sato International Patent Office