Title:
SEMICONDUCTOR INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JP2005086108
Kind Code:
A
Abstract:
To provide a semiconductor integrated circuit which can easily carry out a production test and can reduce a production test man-labor.
As an output voltage of a VDC(voltage down converter) circuit 20 is A/D converted by a A/D converter 22, the output voltage VDCout of the VDC circuit 20 can be observed as a digital quantity and the measurement becomes easy. Preferably, a chip size can be reduced by decreasing the number of terminals 6. Moreover, the terminals 6 used to output the voltage VDCout can be used for other use.
Inventors:
NAKANO NAOYOSHI
NASU TAKASHI
NASU TAKASHI
Application Number:
JP2003318749A
Publication Date:
March 31, 2005
Filing Date:
September 10, 2003
Export Citation:
Assignee:
RENESAS TECH CORP
International Classes:
G01R31/28; G11C5/14; G11C16/00; G11C16/06; G11C16/26; G11C29/00; G11C29/02; G01R31/316; H01L21/822; H01L27/04; H03K19/00; H03K19/0175; H03M1/12; (IPC1-7): H01L21/822; G01R31/28; G01R31/316; H01L27/04; H03K19/00; H03K19/0175
Attorney, Agent or Firm:
Kuro Fukami
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai